Call for Papers
International Workshop on Biometrics and Forensics 2022
Call for Papers—IWBF 2022
- Date: 20.4 - 21.4 2022
- Venue: Salzburg, Austria or Virtual (TBD)
The 2022 IEEE International Workshop on Biometrics and Forensics (IWBF'22) is an international forum devoted to facilitating synergies in research and development among the areas of multimedia forensics, forensic biometrics, and forensic science. State-of-the-art research in areas such as biometrics, forensic science, surveillance, and multimedia forensics will be presented. The 10th edition of IWBF will be a meeting place for those concerned with the use of advanced biometric technologies in forensic applications, attracting participants from industry, research, academia, and end-users.
Topics of interest include, but are not limited to:
- Attacks to biometric recognition systems
- Multimodal biometrics
- Soft biometrics
- Mobile biometrics
- Biometric analysis of crime scenes
- Forensic Science
- Multimedia forensics
- Integrity verification
- Anonymization & Data Privacy
- Data de-identification
- Ethical and societal implications
- Information Theoretic Security
- Adversarial Signal Processing
- Case studies on the aforementioned topics
The IWBF'22 is organised in parallel with the 11th International Conference on Image Processing Theory, Tools and Applications (IPTA 2022) at the same location during the same time to provide the possibility to exploit synergies betweeen the two events (see the IPTA 2022).
Prospective authors are invited to submit original and unpublished work, in English, with up to 6 pages including results, figures and references (overlength submissions will not be reviewed). Paper submissions will be reviewed by at least three members of the Technical Program Committee. This process will be blind, with the results of the review process to be posted on the CMT Website.
Special Journal Issue
It is planned that a selection of the best papers from the workshop will be invited to submit an extended version to special issues of the IET Biometrics journal.